DocumentCode :
2967587
Title :
AlGaN/GaN HEMTs with PAE of 53% at 35 GHz for HPA and Multi-Function MMIC Applications
Author :
Kao, Ming-Yih ; Lee, Cathy ; Hajji, Rached ; Saunier, Paul ; Tserng, Hua-Quen
Author_Institution :
TriQuint Semicond., Richardson
fYear :
2007
fDate :
3-8 June 2007
Firstpage :
627
Lastpage :
629
Abstract :
We would like to report on AlGaN/GaN HEMTs on SiC substrate with stat-of the-art power performance at Ka-band. Power gains of 5.6, 6.3 and 6.7 dB and peak PAE of 53, 53 and 51% were measured at 35 GHz when 200-mum GaN HEMTs were biased at 10, 15 and 20 volts, respectively. At 10 GHz, 400-mum GaN HEMTs exhibited maximum PAE of 67%, power gain of 11.3 dB and power density of 5.6 W/mm when devices were biased at 30 volts. Furthermore, we have also achieved 36 to 38.7 ilBm TOI at a wide range of 10 to 26 dBm total output power for a 400-mum GaN HEMT. Very low noise figures of 1.4 dB at 26 GHz were measured on 100, 200 and 300-mum wide GaN HEMTs as well. In this work, we have demonstrated that GaN HEMTs on SiC substrate is a much superior device technology to GaAs-based pHEMT for microwave applications up through Ka-band.
Keywords :
III-V semiconductors; MIMIC; MMIC power amplifiers; aluminium compounds; gallium compounds; high electron mobility transistors; millimetre wave power amplifiers; silicon compounds; wide band gap semiconductors; AlGaN-GaN; AlGaN-GaN HEMT; HPA; SiC; SiC substrate; frequency 35 GHz; high electron mobility transistor; high power amplifier; multifunction MMIC application; Aluminum gallium nitride; Gain measurement; Gallium nitride; HEMTs; MMICs; MODFETs; Noise figure; Power generation; Power measurement; Silicon carbide; HEMT; MMIC power amplifiers; microwave FETs; millimeter wave FETs;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
ISSN :
0149-645X
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2007.379979
Filename :
4263894
Link To Document :
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