• DocumentCode
    2967642
  • Title

    High dynamic range background light suppression for a TOF distance measurement sensor in 180nm CMOS

  • Author

    Davidovic, Milos ; Hofbauer, Michael ; Schneider-Hornstein, Kerstin ; Zimmermann, Horst

  • Author_Institution
    Inst. of Electrodynamics, Microwave & Circuit Eng., Vienna Univ. of Technol., Vienna, Austria
  • fYear
    2011
  • fDate
    28-31 Oct. 2011
  • Firstpage
    359
  • Lastpage
    362
  • Abstract
    In this paper an integrated background light (BGL) immune single-pixel range finding sensor based on the time-of-flight (TOF) principle is presented. The sensor is fabricated in a standard 180 nm 1P6M CMOS process, reaching 40 × 40 μm2 total pixel area, at a fill factor of ~ 67%. As a key element for the BGL suppression a current-sample-and-hold circuit is introduced. A resulting distance variation as a function of BGL remained in a 1.5 cm range for applied dc light of 180 klx, which is, to our best knowledge, the highest BGL immunity reported so far. Measurement results are carried out at 100 fps, showing a standard deviation of 8 mm at 1 m and ~ 4 cm for distances up to 3.2 m.
  • Keywords
    CMOS integrated circuits; detector circuits; distance measurement; optical sensors; sample and hold circuits; sensors; BGL immunity; CMOS; TOF distance measurement sensor; high dynamic range background light suppression; immune single pixel range finding sensor; integrated background light; size 180 nm; time-of-flight principle; CMOS integrated circuits; CMOS process; Capacitors; Lighting; Optical sensors; Photodiodes; Semiconductor device measurement; 3D camera; Depth sensor; background light suppression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2011 IEEE
  • Conference_Location
    Limerick
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-9290-9
  • Type

    conf

  • DOI
    10.1109/ICSENS.2011.6127060
  • Filename
    6127060