DocumentCode
296772
Title
A simple determination of first order velocity shifts and reflection coefficients for periodic IDTs
Author
Thoma, C. ; Hahn, Y.
Author_Institution
Dept. of Phys., Connecticut Univ., Storrs, CT, USA
Volume
1
fYear
1995
fDate
7-10 Nov 1995
Firstpage
321
Abstract
The design and fabrication of interdigital transducers with metallic fingers on piezoelectric substrates requires accurate values of velocity shifts and reflection coefficients caused by the mechanical and electrical loading of the fingers. We describe a simple and reliable method of determining electric reflection and velocity shifts as well as mechanical velocity shifts to first order in h/λ for transducers with an anisotropic substrates. We calculate SAW velocities and wavefunctions (displacements and potential) for various substrates with one thin metallic layer. A simple multiplication of the resulting material constants with the appropriate geometrical factor yields the desired SAW parameters. An analogous procedure for the mechanical reflection coefficient is being sought. We present results for many standard SAW substrates and crystal orientations with a metallic overlay, and compare with other first order treatments and some experimental results presently available
Keywords
interdigital transducers; surface acoustic wave transducers; ultrasonic reflection; ultrasonic velocity; wave functions; SAW parameters; SAW velocities; SAW wavefunctions; anisotropic substrates; crystal orientations; electrical loading; first order velocity shifts; interdigital transducers; mechanical loading; metallic fingers; metallic overlay; periodic IDTs; piezoelectric substrates; reflection coefficients; Acoustic materials; Anisotropic magnetoresistance; Boundary conditions; Fabrication; Fingers; Physics; Reflection; Shape; Surface acoustic waves; Transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location
Seattle, WA
ISSN
1051-0117
Print_ISBN
0-7803-2940-6
Type
conf
DOI
10.1109/ULTSYM.1995.495590
Filename
495590
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