• DocumentCode
    296772
  • Title

    A simple determination of first order velocity shifts and reflection coefficients for periodic IDTs

  • Author

    Thoma, C. ; Hahn, Y.

  • Author_Institution
    Dept. of Phys., Connecticut Univ., Storrs, CT, USA
  • Volume
    1
  • fYear
    1995
  • fDate
    7-10 Nov 1995
  • Firstpage
    321
  • Abstract
    The design and fabrication of interdigital transducers with metallic fingers on piezoelectric substrates requires accurate values of velocity shifts and reflection coefficients caused by the mechanical and electrical loading of the fingers. We describe a simple and reliable method of determining electric reflection and velocity shifts as well as mechanical velocity shifts to first order in h/λ for transducers with an anisotropic substrates. We calculate SAW velocities and wavefunctions (displacements and potential) for various substrates with one thin metallic layer. A simple multiplication of the resulting material constants with the appropriate geometrical factor yields the desired SAW parameters. An analogous procedure for the mechanical reflection coefficient is being sought. We present results for many standard SAW substrates and crystal orientations with a metallic overlay, and compare with other first order treatments and some experimental results presently available
  • Keywords
    interdigital transducers; surface acoustic wave transducers; ultrasonic reflection; ultrasonic velocity; wave functions; SAW parameters; SAW velocities; SAW wavefunctions; anisotropic substrates; crystal orientations; electrical loading; first order velocity shifts; interdigital transducers; mechanical loading; metallic fingers; metallic overlay; periodic IDTs; piezoelectric substrates; reflection coefficients; Acoustic materials; Anisotropic magnetoresistance; Boundary conditions; Fabrication; Fingers; Physics; Reflection; Shape; Surface acoustic waves; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
  • Conference_Location
    Seattle, WA
  • ISSN
    1051-0117
  • Print_ISBN
    0-7803-2940-6
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1995.495590
  • Filename
    495590