Title :
Effect of temporary temperature change on drift rate of KRISS legal ohm
Author :
Kwang Min Yu ; Young Tae Park ; Kwon Su Han ; Kyung-Hwa Yoo
Author_Institution :
Korea Res. Inst. of Stand. & Sci., Taejon, South Korea
Abstract :
The abnormal drift rate of Thomas type 1 ohm resistors according to temporary temperature change is described and they are compared with NML 1 ohm resistors with almost the same drift rate. It is thought that the major origin of difference between the two types is the coil-mounting structure suffering from stress.
Keywords :
calibration; electric resistance measurement; measurement standards; measurement uncertainty; resistors; thermal stability; thermal stresses; 1 ohm; KRISS legal ohm; Thomas type 1 ohm resistors; abnormal drift rate; coil-mounting structure; resistance standards; temporary temperature change; thermal expansion; thermal stress effect; uncertainty; Abstracts; Calibration; Law; Legal factors; Measurement uncertainty; Metrology; NIST; Resistors; Stress; Temperature;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700037
