DocumentCode :
296831
Title :
Spectral correlation filters for flaw detection
Author :
Donohue, K.D. ; Cheah, H.Y.
Author_Institution :
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY, USA
Volume :
1
fYear :
1995
fDate :
7-10 Nov 1995
Firstpage :
725
Abstract :
A filtering approach is presented that exploits structural differences between the grain and flaw echo through spectral correlation. Analytical and simulation results demonstrate that back-scattered energy from many randomly distributed scatterers within a resolution cell results in no spectral correlation, while back-scattered energy from resolution cells with only a few scatterers exhibits significant spectral correlation. Performance differences between simple spectral correlation filters and conventional spectral filters are discussed for simple and complex (more than one effective scattering center) defects
Keywords :
acoustic correlation; acoustic filters; backscatter; echo; flaw detection; spectral analysis; ultrasonic materials testing; ultrasonic scattering; analytical results; back-scattered energy; complex defects; flaw detection; flaw echo; grain; randomly distributed scatterers; resolution cell; simple defects; simulation results; spectral correlation filters; structural differences; ultrasonic application; Acoustic applications; Analytical models; Autocorrelation; Echo interference; Energy resolution; Filtering; Matched filters; Scattering; Speckle; Wiener filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics Symposium, 1995. Proceedings., 1995 IEEE
Conference_Location :
Seattle, WA
ISSN :
1051-0117
Print_ISBN :
0-7803-2940-6
Type :
conf
DOI :
10.1109/ULTSYM.1995.495671
Filename :
495671
Link To Document :
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