• DocumentCode
    2968512
  • Title

    Simulation of metal vapor breakdown after interrupting a vacuum arc

  • Author

    Zhenxing Wang ; Yingsan Geng ; Zhiyuan Liu

  • Author_Institution
    State Key Lab. of Electr. Insulation & Power Equip., Xi´an Jiaotong Univ., Xi´an, China
  • fYear
    2012
  • fDate
    2-7 Sept. 2012
  • Firstpage
    53
  • Lastpage
    56
  • Abstract
    A breakdown after interrupting a vacuum arc current indicates the interruption limit of a vacuum circuit breaker (VCB). The objective of this paper is to study breakdowns in copper vapor at a density of interruption limit employing Particle in Cell-Monte Carlo Collision (PIC-MCC) method. A model with one dimension in physical space and three dimensions in velocity space was developed with a gap length of 10 mm between the contacts. The model took into account ionization, excitation, elastic collision and secondary emission. We obtained the boundary of instantaneous breakdown region of a VCB through the simulation. The results show that a higher neutral metal vapor density can accelerate the electron avalanche process but the influence was limited when the density exceeded a certain level. Moreover, a higher voltage can also accelerate the avalanche process.
  • Keywords
    Monte Carlo methods; avalanche breakdown; electrical contacts; electron avalanches; secondary electron emission; vacuum arcs; vacuum circuit breakers; vacuum interrupters; MCC; Monte Carlo collision; PIC; VCB; copper vapor; elastic collision; electrical contact; electron avalanche process acceleration; excitation; interruption limit density; ionization; metal vapor breakdown; neutral metal vapor density; particle in cell; secondary emission; size 100 mm; vacuum arc current; vacuum circuit breaker; velocity space; Interrupters; Ions; Metals; Numerical models; Plasmas; Vacuum arcs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum (ISDEIV), 2012 25th International Symposium on
  • Conference_Location
    Tomsk
  • ISSN
    1093-2941
  • Print_ISBN
    978-1-4673-1263-9
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2012.6412448
  • Filename
    6412448