• DocumentCode
    2968536
  • Title

    A Robust 11W High efficiency X-band GaInP HBT amplifier

  • Author

    Couturier, A.M. ; Heckmann, S. ; Serru, V. ; Huet, T. ; Chaumas, P. ; Fontecave, J.J. ; Camiade, M. ; Viaud, J.P. ; Piotrowicz, S.

  • Author_Institution
    United Monolithic Semicond. (UMS), Orsay
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    813
  • Lastpage
    816
  • Abstract
    A monolithic two stages high power, high efficiency and high robustness amplifier was developed for X-band applications. The combination of the improvement of the UMS HBT process called HB20P (GalnP/GaAs) in term of breakdown, the consideration of mismatch and overdrive stability in the design. The MMIC HPA which includes a bias control circuit and a TTL interface in a surface of 18.4 mm2 provides 11 W output power associated to a PAE of about 43% at ambient temperature and can operate at 8 dB compression with an output return loss of 1.7, in a wide temperature range. The high level of performance, the low sensitivity to the environment and the integrated biasing control make of this amplifier an excellent candidate for X band applications such as phased array active antennas.
  • Keywords
    III-V semiconductors; MMIC power amplifiers; bipolar MMIC; gallium arsenide; gallium compounds; heterojunction bipolar transistors; indium compounds; GaInP-GaAs; HB20P; MMIC high power amplifier; TTL interface; UMS HBT process; bias control circuit; high efficiency X-band HBT amplifier; integrated biasing control; mismatch stability; monolithic two stages amplifier; overdrive stability; phased array active antennas; power 11 W; power added efficiency; return loss; Circuit stability; Electric breakdown; Gallium arsenide; Heterojunction bipolar transistors; High power amplifiers; MMICs; Phased arrays; Robustness; Temperature distribution; Temperature sensors; HBT; High Power Amplifier; MMIC; Power Added Efficiency; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380083
  • Filename
    4263944