DocumentCode :
2968577
Title :
A High Power and High Breakdown Voltage Millimeter-Wave GaAs pHEMT with Low Nonlinear Drain Resistance
Author :
Amasuga, Hirotaka ; Inoue, Akira ; Goto, Seiki ; Kunii, Tetsuo ; Yamamoto, Yoshitsugu ; Oku, Tomoti ; Ishikawa, Takahide
Author_Institution :
Mitsubishi Electr. Corp., Itami
fYear :
2007
fDate :
3-8 June 2007
Firstpage :
821
Lastpage :
824
Abstract :
A new GaAs pHEMT structure, which has achieved both high power density and high breakdown voltage for millimeter-wave amplifiers, is presented. According to the nonlinear drain resistance model previously proposed, we have adopted a "Stepped Recess" structure, which includes a GaAs buried layer 150 nm thick to reduce the nonlinear drain resistance and a recessed area at the gate side to control the gate leakage current. Consequently, even at the 2.0 mum width of the gate-to-drain separation, the developed pHEMT has showed a high power density of 0.65 W/mm in the Ka band, and high on-state breakdown voltage of over 30 V at once. In addition, the proposed nonlinear drain resistance model effectively explains this power performance.
Keywords :
HEMT circuits; III-V semiconductors; gallium arsenide; high electron mobility transistors; millimetre wave amplifiers; millimetre wave field effect transistors; GaAs; breakdown voltage; frequency 27 GHz to 40 GHz; gate leakage current; gate-to-drain separation; millimeter-wave pHEMT; nonlinear drain resistance model; power density; stepped recess structure; Electric resistance; Frequency; Gallium arsenide; High power amplifiers; Leakage current; Millimeter wave technology; Millimeter wave transistors; PHEMTs; Power generation; Semiconductor optical amplifiers; GaAs; breakdown voltage; millimeter-wave; pHEMT; power density;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
ISSN :
0149-645X
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
Type :
conf
DOI :
10.1109/MWSYM.2007.380085
Filename :
4263946
Link To Document :
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