• DocumentCode
    2968577
  • Title

    A High Power and High Breakdown Voltage Millimeter-Wave GaAs pHEMT with Low Nonlinear Drain Resistance

  • Author

    Amasuga, Hirotaka ; Inoue, Akira ; Goto, Seiki ; Kunii, Tetsuo ; Yamamoto, Yoshitsugu ; Oku, Tomoti ; Ishikawa, Takahide

  • Author_Institution
    Mitsubishi Electr. Corp., Itami
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    821
  • Lastpage
    824
  • Abstract
    A new GaAs pHEMT structure, which has achieved both high power density and high breakdown voltage for millimeter-wave amplifiers, is presented. According to the nonlinear drain resistance model previously proposed, we have adopted a "Stepped Recess" structure, which includes a GaAs buried layer 150 nm thick to reduce the nonlinear drain resistance and a recessed area at the gate side to control the gate leakage current. Consequently, even at the 2.0 mum width of the gate-to-drain separation, the developed pHEMT has showed a high power density of 0.65 W/mm in the Ka band, and high on-state breakdown voltage of over 30 V at once. In addition, the proposed nonlinear drain resistance model effectively explains this power performance.
  • Keywords
    HEMT circuits; III-V semiconductors; gallium arsenide; high electron mobility transistors; millimetre wave amplifiers; millimetre wave field effect transistors; GaAs; breakdown voltage; frequency 27 GHz to 40 GHz; gate leakage current; gate-to-drain separation; millimeter-wave pHEMT; nonlinear drain resistance model; power density; stepped recess structure; Electric resistance; Frequency; Gallium arsenide; High power amplifiers; Leakage current; Millimeter wave technology; Millimeter wave transistors; PHEMTs; Power generation; Semiconductor optical amplifiers; GaAs; breakdown voltage; millimeter-wave; pHEMT; power density;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380085
  • Filename
    4263946