Title :
A K-band low cost plastic packaged high linearity Power Amplifier with integrated ESD protection for Multi-band Telecom applications
Author :
Lefebvre, B. ; Bouw, D. ; Lhortolary, J. ; Chang, C. ; Tranchant, S. ; Camiade, M.
Author_Institution :
United Monolithic Semicond., Orsay
Abstract :
The design and performance of cost effective packaged linear power amplifier in K-band is reported in this paper. Based on a specific characterizations and model developments done on a standard 6-inch 0.15-mum GaAs power pHEMT technology, a high linearity-oriented design has been done and is described. Thanks to this work, excellent linearity performances have been achieved. This power amplifier exhibits 19 dB linear gain in the 17 to 27 GHz frequency band with 28.5 dBm CW output power at 1 dB gain compression and 29.5 dBm in saturated mode. The output referred third-order intercept point (OIP3) exceeds 38 dBm over the whole frequency band. As this amplifier was developed and was proposed in SMD package (standard 32L-QFN5X5 plastic molded package), it integrates an on-chip ESD protection. This makes this component easy to use in standard SMT assembly lines and significantly contributes to the reduction of the overall module cost.
Keywords :
HEMT integrated circuits; III-V semiconductors; MMIC power amplifiers; electrostatic discharge; field effect analogue integrated circuits; gallium arsenide; integrated circuit packaging; integrated circuit reliability; plastic packaging; power HEMT; surface mount technology; GaAs; GaAs power pHEMT technology; K-band amplifier; MMIC; SMD package; SMT assembly lines; frequency 17 GHz to 27 GHz; gain 1 dB; gain 19 dB; gain compression; integrated ESD protection; linearity-oriented design; multiband telecom applications; on-chip ESD protection; output referred third-order intercept point; plastic packaged linear power amplifier; size 0.15 mum; standard 32L-QFN5X5 plastic molded package; surface mount plastic packaging; Costs; Electrostatic discharge; High power amplifiers; K-band; Linearity; Plastic packaging; Power amplifiers; Protection; Standards development; Telecommunications; ESD; MMICs; OIP3; PA; Package; QFN; SMD;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380086