• DocumentCode
    2969123
  • Title

    Field electron emission current in vacuum interrupters after large inrush current

  • Author

    Smeets, R.P.P. ; Kuivenhoven, S. ; Chakraborty, Shiladri ; Sandolache, Gabriela

  • Author_Institution
    Testing, Inspections & Certification Group, DNV KEMA, Arnhem, Netherlands
  • fYear
    2012
  • fDate
    2-7 Sept. 2012
  • Firstpage
    157
  • Lastpage
    160
  • Abstract
    Field electron emission (FEE) current in the open(ing) gap of nine different designs of 36 kV vacuum interrupters under standard recovery voltage conditions was measured during full-power back-to-back capacitive switching. During closing operation, 20 kA inrush current (@ 4250 Hz) was applied. The measurement system is described, able to measure FEE current with a threshold of 30 μA but that also has to withstand a full capacitor bank discharge current of up to 40 kA after re-strike. It was concluded that in spite of the wide variety of measured FEE current magnitude (up to several mA) there is no direct relationship between magnitude of FEE current and probability of breakdown. Longer arc duration of the normal load current reduces the FEE current level after load current interruption.
  • Keywords
    capacitor switching; electric current measurement; electron field emission; probability; vacuum arcs; vacuum breakdown; vacuum interrupters; FEE; arc duration; breakdown probability; current 20 kA; current 30 muA; current magnitude; field electron emission current; frequency 4250 Hz; full capacitor bank discharge current; full-power back-to-back capacitive switching; large inrush current; load current interruption; measurement system; normal load current reduction; standard recovery voltage condition; vacuum interrupter; voltage 36 kV; Current measurement; Electric breakdown; Interrupters; Surges; Switches; Voltage measurement; Welding;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum (ISDEIV), 2012 25th International Symposium on
  • Conference_Location
    Tomsk
  • ISSN
    1093-2941
  • Print_ISBN
    978-1-4673-1263-9
  • Electronic_ISBN
    1093-2941
  • Type

    conf

  • DOI
    10.1109/DEIV.2012.6412476
  • Filename
    6412476