CAD in test

Author

Riesgo, T. ; de la Torre, E. ; Torroja, Y. ; Olías, E. ; Uceda, J.

Author_Institution

ETSI Industriales, Univ. Politecnica de Madrid, Spain

Volume

1

fYear

34881

fDate

10-14 Jul1995

Firstpage

33

Abstract

This paper presents a survey of the most important computer aided design (CAD) tools used for testing purposes. The paper is oriented to give an overview of the main techniques used in test, as well as an advance of the technology that is foreseen in the test arena for the future. The most advanced test methods have been typically developed for integrated circuits. As digital systems grow in complexity, some of the techniques used in IC testing are being used for systems. For this reason, this paper mainly deals with CAD tools for IC testing, although some extensions are presented, for system testing

Keywords

circuit CAD; integrated circuit testing; CAD; IC testing; computer aided design tools; digital systems; fault simulation; integrated circuits; test pattern generation; test synthesis; testing; Circuit testing; Design automation; Design for testability; Design methodology; Digital systems; Electronic equipment testing; Integrated circuit technology; Integrated circuit testing; Paper technology; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics, 1995. ISIE '95., Proceedings of the IEEE International Symposium on

Conference_Location

Athens

Print_ISBN

0-7803-7369-3

Type

conf

DOI

10.1109/ISIE.1995.496474

Filename

496474