Author :
Riesgo, T. ; de la Torre, E. ; Torroja, Y. ; Olías, E. ; Uceda, J.
Author_Institution :
ETSI Industriales, Univ. Politecnica de Madrid, Spain
Abstract :
This paper presents a survey of the most important computer aided design (CAD) tools used for testing purposes. The paper is oriented to give an overview of the main techniques used in test, as well as an advance of the technology that is foreseen in the test arena for the future. The most advanced test methods have been typically developed for integrated circuits. As digital systems grow in complexity, some of the techniques used in IC testing are being used for systems. For this reason, this paper mainly deals with CAD tools for IC testing, although some extensions are presented, for system testing
Keywords :
circuit CAD; integrated circuit testing; CAD; IC testing; computer aided design tools; digital systems; fault simulation; integrated circuits; test pattern generation; test synthesis; testing; Circuit testing; Design automation; Design for testability; Design methodology; Digital systems; Electronic equipment testing; Integrated circuit technology; Integrated circuit testing; Paper technology; System testing;
Conference_Titel :
Industrial Electronics, 1995. ISIE '95., Proceedings of the IEEE International Symposium on
Conference_Location :
Athens
Print_ISBN :
0-7803-7369-3
DOI :
10.1109/ISIE.1995.496474
