Title :
Distribution property of transient recovery voltage of vacuum switch with multi-break during short-circuit current interruption
Author :
Cheng Xian ; Duan Xiongying ; Ge Guowei ; Liao Minfu ; Zou Jiyan
Author_Institution :
Sch. of Electr. Eng., Dalian Univ. of Technol., Dalian, China
Abstract :
Voltage distribution relation of vacuum switch (VS) with multi-break determined its breaking capacity in certain degree. The distribution properties of transient recovery voltage (TRV) and dielectric recovery characteristics of vacuum switch are studied by experiment in this paper. The experimental prototype is set up. The voltage distribution of the interrupters with grading capacitors and without grading capacitors is compared. When three interrupters parallel connect different grading capacitors, short-circuit current is interrupted under the conditions of three interrupters contacts synchronous or asynchronous parting. The experimental results show that successful interruption mostly due to the good voltage sharing in the dielectric recovery process. The voltage distribution is mainly decided by interrupters´ arc resistances in the dielectric recovery process, whereas it is decided by their equivalent capacitance after the dielectric recovery process. Therefore, high controllability actuator and proper grading capacitors are important factors for multi-break vacuum switch to interrupt successfully.
Keywords :
capacitance; capacitors; short-circuit currents; transients; vacuum arcs; vacuum interrupters; voltage distribution; controllability actuator; dielectric recovery process; equivalent capacitance; grading capacitor; interrupter arc resistance; multibreak vacuum switch; short-circuit current interruption; synchronous interrupter contact; transient recovery voltage distribution; vacuum switch; voltage sharing; Actuators; Capacitance; Capacitors; Interrupters; Prototypes; Switches;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2012 25th International Symposium on
Conference_Location :
Tomsk
Print_ISBN :
978-1-4673-1263-9
Electronic_ISBN :
1093-2941
DOI :
10.1109/DEIV.2012.6412496