Title : 
Front-end IP development: Basic know-how
         
        
            Author : 
Oudjida, A.K. ; Benamrouche, D. ; Lien, Matthew
         
        
            Author_Institution : 
Centre de Dev. des Technol. Avancees, Algiers
         
        
        
        
        
        
            Abstract : 
IP reuse is a part of the solution to the well known design-gap problem. It aims at closing the gap between what semiconductor-technology is offering in terms of integration capacity, and what is practically possible to implement in silicon with current design methodologies and tools. This paper summarizes in bullet-point-style the most important issues related to front-end IP-development and introduces a detailed technical documentation template for small to medium size IPs as well as a number of recommendations for hardware/software verification of the IP. The purpose of this paper is to provide students and engineers with basic know-how to develop high-quality and qualified IPs for modern SoC applications. This includes all necessary steps from requirements specification till the validation of the IP core. A special emphasis is devoted to documentation and verification as they are the most time-consuming phases in IP-projects.
         
        
            Keywords : 
integrated circuit design; logic design; semiconductor technology; silicon; system-on-chip; IP core; design-gap problem; documentation process; front-end IP-development; functional verification process; hardware-software verification; modern SoC applications; semiconductor-technology; silicon implementation; technical documentation template; Application software; Circuit testing; Design methodology; Documentation; Hardware; Laboratories; Microelectronics; Process design; Productivity; Silicon;
         
        
        
        
            Conference_Titel : 
Design & Technology of Integrated Systems in Nanoscale Era, 2007. DTIS. International Conference on
         
        
            Conference_Location : 
Rabat
         
        
            Print_ISBN : 
978-1-4244-1277-8
         
        
            Electronic_ISBN : 
978-1-4244-1278-5
         
        
        
            DOI : 
10.1109/DTIS.2007.4449493