Title :
Direct measurement of standard cells with a Josephson junction array voltage standard
Author :
Katkov, A. ; Niemeyer, J. ; Behr, R.
Author_Institution :
Inst. for Metrol., St. Petersburg, Russia
Abstract :
The dynamic parameters of standard cells in a circuit for the direct measurement of a standard cell with a Josephson junction array voltage standard were analysed. The parameters of the models of a null-detector and a standard cell were experimentally determined. It was found that it is possible to directly measure a standard cell with a voltage standard, with an uncertainty of about 0.001 ppm.
Keywords :
calibration; cellular arrays; function generators; integrated circuit measurement; measurement standards; measurement uncertainty; superconducting junction devices; voltage measurement; Josephson junction array voltage standard; Nyquist noise; calibration circuit; direct measurement; dynamic parameters; nanovoltmeter; null-detector models; standard cells; uncertainty; voltage jumps influence; voltage restoration time; Battery charge measurement; Circuits; Detectors; Diodes; Equations; Gears; Gold; Josephson junctions; Measurement standards; Voltage;
Conference_Titel :
Precision Electromagnetic Measurements Digest, 1998 Conference on
Conference_Location :
Washington, DC, USA
Print_ISBN :
0-7803-5018-9
DOI :
10.1109/CPEM.1998.700051
