DocumentCode :
2970224
Title :
First-principle study on arsenic impurities and mercury vacancy in Hg1-xCdxTe
Author :
Sun, L.Z. ; Chen, X.S. ; Lu, Wei ; Shen, S.C.
Author_Institution :
Shanghai Inst. of Tech. Phys., Chinese Acad. of Sci., China
Volume :
1
fYear :
2005
fDate :
19-23 Sept. 2005
Firstpage :
259
Abstract :
Using first principle method, we have calculated the effect of the in-situ arsenic impurity and the mercury vacancy on the bonding mechanism and the relaxation effects in the Hg1-xCdxTe (MCT). We have obtained the bonding charge density, density of states and novel relaxation results. The double acceptors of the mercury vacancy, and the accepter and donor levels of AsTe and AsHg doping have been calculated, respectively. It has been found that the As impurities have the covalent bonding characteristics with host atoms. The relaxation calculations indicate that the nearest neighbor Te around the Hg vacancy defect contract toward to the defect site. The calculated results of charge density and bonding charge density reveal that the contracts relaxation attributes to the concentration of the electrons around the defect site accompanying the dangling bond reconstruction, which induce extra Coulomb interactions between the defect site and the nearest neighbour Te.
Keywords :
II-VI semiconductors; arsenic; cadmium compounds; charge density waves; dangling bonds; density functional theory; impurities; mercury compounds; semiconductor doping; vacancies (crystal); Coulomb interactions; HgCdTe:As; bonding charge density; bonding mechanism; contracts relaxation; covalent bonding characteristics; dangling bond reconstruction; defect site; doping; first principle method; impurities; relaxation effects; state density; vacancy defect; Bonding; Contracts; Doping; Impurities; Infrared detectors; Mercury (metals); Molecular beam epitaxial growth; Physics; Semiconductor materials; Tellurium;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN :
0-7803-9348-1
Type :
conf
DOI :
10.1109/ICIMW.2005.1572507
Filename :
1572507
Link To Document :
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