• DocumentCode
    2970308
  • Title

    CMIT — A novel cluster-based topology for 3D stacked architectures

  • Author

    Daneshtalab, Masoud ; Ebrahimi, Masoumeh ; Liljeberg, Pasi ; Plosila, Juha ; Tenhunen, Hannu

  • Author_Institution
    Dept. of Inf. Technol., Univ. of Turku, Turku, Finland
  • fYear
    2010
  • fDate
    16-18 Nov. 2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Combining the benefits of 3D IC and Network-on-Chip (NoC) schemes, provides a significant performance gain for 3D stacked architectures. In recent years, Through-Silicon-Via (TSV), employed for inter-layer connectivity (vertical channel), has attracted a lot of interest since it enables faster and more power efficient inter-layer communication across multiple stacked layers. However, the area overhead of TSVs reduces wafer utilization and yield which impact design of 3D architectures using a large number of TSVs. In this paper, we propose a novel stacked topology, named CMIT (Cluster Mesh Inter-layer Topology) for 3D architectures to reduce the area overhead of TSVs and power dissipation on each layer with minimal performance penalty. Experimental results with synthetic test cases demonstrate that the presented topology can save more than 75% of TSV area footprint and reduces more than 10% of power consumption with a negligible performance overhead.
  • Keywords
    integrated circuit design; integrated circuit yield; low-power electronics; network topology; network-on-chip; three-dimensional integrated circuits; 3D IC; 3D architecture design; 3D stacked architecture; cluster mesh interlayer topology; cluster-based topology; inter-layer communication; inter-layer connectivity; network-on-chip scheme; power dissipation; stacked topology; through-silicon-via; wafer utilization; wafer yield; Computer architecture; Network topology; Nickel; System-on-a-chip; Three dimensional displays; Through-silicon vias; Topology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    3D Systems Integration Conference (3DIC), 2010 IEEE International
  • Conference_Location
    Munich
  • Print_ISBN
    978-1-4577-0526-7
  • Type

    conf

  • DOI
    10.1109/3DIC.2010.5751452
  • Filename
    5751452