• DocumentCode
    2970340
  • Title

    A Model Driven Approach to Represent Sequence Diagrams as Free Choice Petri Nets

  • Author

    Ameedeen, Mohamed Ariff ; Bordbar, Behzad

  • Author_Institution
    Sch. of Comput. Sci., Univ. of Birmingham, Birmingham
  • fYear
    2008
  • fDate
    15-19 Sept. 2008
  • Firstpage
    213
  • Lastpage
    221
  • Abstract
    Model driven development (MDD) aims to promote the role of modeling in software engineering. Enterprise systems and architectures are often modeled via multiple representations. For example UML models are widely used by the designers to capture various viewpoint of the system; while formal models using languages such as CSP, Z and Petri nets are suitable for the analysis. Model transformation techniques developed as a part of MDD can be applied to generate one model from another model automatically. This allows benefiting from the tools and techniques developed and used in multiple languages. This paper presents a method of applying MDD model transformation from UML 2.0 sequence diagrams to Petri nets. The paper shows that the model transformation results in free choice Petri nets. As a result, the low complexity of analysis and the synthesis techniques can be applied to the models of enterprise systems which are captured in UML sequence diagrams.
  • Keywords
    Petri nets; Unified Modeling Language; business data processing; software engineering; UML 2.0 sequence diagrams; UML models; enterprise systems; formal models; free choice Petri nets; model driven approach; model driven development; model transformation techniques; sequence diagrams; software engineering; Application software; Computer architecture; Computer science; Concurrent computing; Distributed computing; Information security; Petri nets; Software engineering; Software tools; Unified modeling language; Model Driven; Model Transformation; Petri Nets; Sequence Diagrams;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Enterprise Distributed Object Computing Conference, 2008. EDOC '08. 12th International IEEE
  • Conference_Location
    Munich
  • ISSN
    1541-7719
  • Print_ISBN
    978-0-7695-3373-5
  • Type

    conf

  • DOI
    10.1109/EDOC.2008.42
  • Filename
    4634772