Title :
Characterization of Multi-Walled Carbon Nanotube (MWNT) Papers Using X-Band Waveguides
Author :
Xin, Hao ; Wang, Lu ; Carnahan, David
Author_Institution :
Arizona Univ., Tucson
Abstract :
Multi-walled carbon nanotubes (MWNT) are characterized at X-band (8-12 GHz) by waveguide measurements. The scattering parameters (S-parameters) of thin MWNT papers containing a large ensemble of randomly oriented nanotubes are measured by a vector network analyzer. An extraction algorithm has been developed to compute the effective complex permittivity (epsiv = epsiv\´ - j epsiv") and permeability (mu = mu\´ - j mu") of the MWNT papers from the measured S-parameters. The extracted effective medium parameters are verified by finite-element simulations using Ansoft HFSS. The uncertainties for this characterization method are analyzed. The extracted conductivity of the MWNT papers is on the order of 1500 S/m and the dielectric constant is on the order of -500. No significant magnetic responses are observed. To overcome the relatively large uncertainty associated with the reflection coefficient Sll, the extracted imaginary permittivity (epsiv") is fitted by the Drude model and the dielectric constant (epsiv\´) and permeability are recalculated.
Keywords :
S-parameters; carbon nanotubes; dielectric waveguides; finite element analysis; materials testing; measurement uncertainty; microwave materials; network analysers; paper; permeability; permittivity; Ansoft HFSS; C; Drude model; MWNT; S-parameters; X-band waveguides; complex permittivity; dielectric constant; electric conductivity; finite-element simulations; frequency 8 GHz to 12 GHz; measurement uncertainties; multiwalled carbon nanotube papers; permeability; randomly oriented nanotubes; reflection coefficient; scattering parameters; vector network analyzer; waveguide measurements; Carbon nanotubes; Computational modeling; Conductivity; Dielectric constant; Dielectric measurements; Finite element methods; Magnetic analysis; Permeability measurement; Permittivity measurement; Scattering parameters; Drude model; MWNT; Permittivity; conductivity; permeability; waveguide;
Conference_Titel :
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location :
Honolulu, HI
Print_ISBN :
1-4244-0688-9
Electronic_ISBN :
0149-645X
DOI :
10.1109/MWSYM.2007.380341