Title :
Decoder-based Decompression for test sets containing don’t cares
Author :
Voyiatzis, I. ; Antonopoulou, H.
Author_Institution :
Educational Inst. of Athens, Athens
Abstract :
A novel scheme for decompressing test sets containing don´t care values is presented. Compared to traditional scan-based schemes, the proposed schemes provides for lower test application time, lower hardware overhead and lower power consumption during the application of the test set.
Keywords :
automatic test pattern generation; data compression; decoding; low-power electronics; decoder-based decompression; test sets decompression; Application software; Circuit testing; Decoding; Educational technology; Energy consumption; Hardware; Informatics; Latches; Power engineering computing; System testing;
Conference_Titel :
Design & Technology of Integrated Systems in Nanoscale Era, 2007. DTIS. International Conference on
Conference_Location :
Rabat
Print_ISBN :
978-1-4244-1277-8
Electronic_ISBN :
978-1-4244-1278-5
DOI :
10.1109/DTIS.2007.4449526
