• DocumentCode
    2970768
  • Title

    High Efficiency GaN HEMT Power Amplifier optimized for OFDM EER Transmitter

  • Author

    Hong, Sungchul ; Young Yun Woo ; Kim, Ildu ; Kim, Jangheon ; Moon, Junghwan ; Kim, Han Seok ; Jong Sung Lee ; Kim, Bumman

  • Author_Institution
    Samsung Electron. Co., Suwon
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    1247
  • Lastpage
    1250
  • Abstract
    We have proposed a highly efficient power amplifier (PA) for the envelope elimination and restoration (EER) transmitter using gallium nitride (GaN) HEMT. The class AB, B, C and F mode PAs have been implemented with EUDYNA´s 10 watts GaN HEMT and compared the bias modulation performances in order to investigate the optimum PA structure. The proposed class F mode PA has been biased at class C and adopted a new output matching topology that improves the overall transmitter efficiency. For the WiMAX OFDM signal, the calculated overall drain efficiencies of the optimized EER amplifier, which are based on the measuremed bias dependent efficiencies, are about 73 % at an average power of 31 dBm at 2.14 GHz. The proposed highly efficient bias modulation PA for the EER transmitter provides a superior overall efficiency than that of any conventional switching or saturation mode PAs.
  • Keywords
    III-V semiconductors; OFDM modulation; UHF amplifiers; UHF transistors; WiMax; gallium compounds; power HEMT; power amplifiers; radio transmitters; wide band gap semiconductors; GaN; OFDM EER transmitter; WiMAX OFDM signal; bias dependent efficiency; bias modulation performances; class AB mode PA; class B mode PA; class C mode PA; class F mode PA; envelope elimination-and-restoration transmitter; high-efficiency HEMT power amplifier; overall drain efficiency; Gallium nitride; HEMTs; High power amplifiers; III-V semiconductor materials; Impedance matching; OFDM modulation; Power amplifiers; Topology; Transmitters; WiMAX;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380394
  • Filename
    4264057