Title :
On adaptive diagnostic test generation
Author :
Gong, Y. ; Chakravarty, S.
Author_Institution :
Dept. of Comput. Sci., State Univ. of New York, Buffalo, NY, USA
Abstract :
Adaptive diagnosis, a paradigm for diagnosis, is defined. A system based on this paradigm, for I/sub DDQ/ measurement based diagnosis of bridging faults, is reported. Experimental evaluation of the system shows it to be substantially superior to existing systems, especially for larger circuits.
Keywords :
logic design; logic testing; I/sub DDQ/ measurement based diagnosis; adaptive diagnostic test generation; bridging faults; Circuit faults; Circuit simulation; Circuit testing; Computational modeling; Computer science; Dictionaries; Electrical fault detection; Fabrication; Fault diagnosis; Logic testing;
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
Print_ISBN :
0-8186-8200-0
DOI :
10.1109/ICCAD.1995.480010
