DocumentCode
2971150
Title
An 8-12GHz capacitive power sensor based on MEMS cantilever beam
Author
Yi, Zhenxiang ; Liao, Xiaoping ; Zhu, Zheng
Author_Institution
Key Lab. of MEMS of the Minist. of Educ., Southeast Univ., Nanjing, China
fYear
2011
fDate
28-31 Oct. 2011
Firstpage
1958
Lastpage
1961
Abstract
In this paper, an 8-12GHz capacitive power sensor based on MEMS cantilever beam is proposed. When the displacement of the cantilever beam is far less than the initial height of the air gap, the capacitance between the measuring electrode and the cantilever beam has a linear dependence on the input power of the RF signal. The novelty of the presented design provides not only negligible disturbance of the input signal but also an improved sensitivity because of small elastic coefficient of the cantilever beam. Impedance compensating technology by modifying the slot width of the CPW transmission line is adopted and the validity is verified by the simulation of HFSS software. The presented power sensor has been designed, optimized and fabricated using GaAs MMIC process. The measured return loss is less than -25dB and the insertion loss is around 0.1dB at 8-12GHz. DC voltage measurement and RF power measurement have been performed to test against the validity of the design. A sensitivity of 6aF·mW-1 is obtained which is limited by the thickness of the cantilever beam, the initial height of the air gap and the area of the measuring electrode.
Keywords
III-V semiconductors; MMIC; cantilevers; capacitive sensors; coplanar transmission lines; coplanar waveguides; gallium arsenide; microelectrodes; microsensors; microwave detectors; power measurement; slot lines; voltage measurement; CPW transmission line; DC voltage measurement; GaAs; HFSS software simulation; MEMS cantilever beam; MMIC process; RF power measurement; RF signal; air gap height; cantilever beam displacement; cantilever beam elastic coefficient; capacitive power sensor; electrode measurement; frequency 8 GHz to 12 GHz; impedance compensating technology; insertion loss; return loss; Capacitance; Loss measurement; Micromechanical devices; Power measurement; Structural beams; Transmission line measurements; Voltage measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2011 IEEE
Conference_Location
Limerick
ISSN
1930-0395
Print_ISBN
978-1-4244-9290-9
Type
conf
DOI
10.1109/ICSENS.2011.6127229
Filename
6127229
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