DocumentCode :
2971166
Title :
Diagnosis of realistic bridging faults with single stuck-at information
Author :
Chess, B. ; Lavo, D.B. ; Ferguson, F.J. ; Larrabee, T.
Author_Institution :
Dept. of Comput. Eng., California Univ., Santa Cruz, CA, USA
fYear :
1995
fDate :
5-9 Nov. 1995
Firstpage :
185
Lastpage :
192
Abstract :
Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnosing bridging faults using single stuck-at dictionaries was applied only to small circuits, produced large and imprecise diagnoses, and did not take into account the Byzantine Generals Problem for bridging faults. We analyze the original technique and improve it by introducing the concepts of match restriction, match requirement, and failure recovery. Our new technique, which requires no information other than that used by standard stuck-at methods, produces diagnoses that are an order of magnitude smaller than those produced by the original technique and produces many fewer misleading diagnoses than that of traditional stuck-at diagnosis.
Keywords :
fault diagnosis; fault location; logic testing; failure analysis; failure recovery; fault diagnosis; match requirement; match restriction; realistic bridging faults diagnosis; single stuck-at dictionaries; single stuck-at information; stuck-at diagnosis; stuck-at methods; CMOS technology; Circuit faults; Circuit testing; Dictionaries; Electrical fault detection; Failure analysis; Fault detection; Fault diagnosis; Logic; Semiconductor device modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer-Aided Design, 1995. ICCAD-95. Digest of Technical Papers., 1995 IEEE/ACM International Conference on
Conference_Location :
San Jose, CA, USA
ISSN :
1092-3152
Print_ISBN :
0-8186-8200-0
Type :
conf
DOI :
10.1109/ICCAD.1995.480011
Filename :
480011
Link To Document :
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