DocumentCode
2971178
Title
Study on transient recovery voltage distribution mechanism and grading capacitor of double-break vacuum circuit breaker
Author
Shengwen Shu ; Jiangjun Ruan ; Daochun Huang ; Gaobo Wu ; Chang Liu
Author_Institution
Sch. of Electr. Eng., Wuhan Univ., Wuhan, China
fYear
2012
fDate
2-7 Sept. 2012
Firstpage
501
Lastpage
504
Abstract
To keep the uniform distribution of the transient recovery voltage (TRV) across each vacuum interrupter (VI) is very important for the breaking capability of double-break vacuum circuit breakers (VCBs). According to the transient equivalent circuit of double-break VCBs, a mathematical model describing the TRV distribution characteristics was established; it revealed that the bias of TRV distribution was caused by the stray capacitance and the imbalanced post-arc plasma characteristics in each VI. The validity of the TRV distribution model was proved by simulation results based on a vacuum arc model. The experimental results under different values of grading capacitors demonstrated their effectiveness in improving the even degree of the TRV distribution in double-break VCBs. However, too large grading capacitor significantly magnified the amplitude and duration of the reignition current, which was detrimental to the successful breaking of double-break VCBs. It is advisable for this reason to limit the value of grading capacitors to those ranges which can guarantee sufficiently improve the TRV distribution.
Keywords
mathematical analysis; vacuum arcs; vacuum circuit breakers; TRV distribution; breaking capability; double-break vacuum circuit breakers; grading capacitors; mathematical model; post-arc plasma characteristics; stray capacitance; transient equivalent circuit; transient recovery voltage distribution mechanism; uniform distribution; vacuum arc model; vacuum interrupter; Capacitance; Capacitors; Circuit breakers; Interrupters; Mathematical model; Plasmas; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2012 25th International Symposium on
Conference_Location
Tomsk
ISSN
1093-2941
Print_ISBN
978-1-4673-1263-9
Electronic_ISBN
1093-2941
Type
conf
DOI
10.1109/DEIV.2012.6412565
Filename
6412565
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