DocumentCode :
2971178
Title :
Study on transient recovery voltage distribution mechanism and grading capacitor of double-break vacuum circuit breaker
Author :
Shengwen Shu ; Jiangjun Ruan ; Daochun Huang ; Gaobo Wu ; Chang Liu
Author_Institution :
Sch. of Electr. Eng., Wuhan Univ., Wuhan, China
fYear :
2012
fDate :
2-7 Sept. 2012
Firstpage :
501
Lastpage :
504
Abstract :
To keep the uniform distribution of the transient recovery voltage (TRV) across each vacuum interrupter (VI) is very important for the breaking capability of double-break vacuum circuit breakers (VCBs). According to the transient equivalent circuit of double-break VCBs, a mathematical model describing the TRV distribution characteristics was established; it revealed that the bias of TRV distribution was caused by the stray capacitance and the imbalanced post-arc plasma characteristics in each VI. The validity of the TRV distribution model was proved by simulation results based on a vacuum arc model. The experimental results under different values of grading capacitors demonstrated their effectiveness in improving the even degree of the TRV distribution in double-break VCBs. However, too large grading capacitor significantly magnified the amplitude and duration of the reignition current, which was detrimental to the successful breaking of double-break VCBs. It is advisable for this reason to limit the value of grading capacitors to those ranges which can guarantee sufficiently improve the TRV distribution.
Keywords :
mathematical analysis; vacuum arcs; vacuum circuit breakers; TRV distribution; breaking capability; double-break vacuum circuit breakers; grading capacitors; mathematical model; post-arc plasma characteristics; stray capacitance; transient equivalent circuit; transient recovery voltage distribution mechanism; uniform distribution; vacuum arc model; vacuum interrupter; Capacitance; Capacitors; Circuit breakers; Interrupters; Mathematical model; Plasmas; Transient analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2012 25th International Symposium on
Conference_Location :
Tomsk
ISSN :
1093-2941
Print_ISBN :
978-1-4673-1263-9
Electronic_ISBN :
1093-2941
Type :
conf
DOI :
10.1109/DEIV.2012.6412565
Filename :
6412565
Link To Document :
بازگشت