• DocumentCode
    2971465
  • Title

    An S-band 100W GaN Protection Switch

  • Author

    Hangai, Masatake ; Nishino, Tamotsu ; Kamo, Yoshitaka ; Miyazaki, Moriyasu

  • Author_Institution
    Mitsubishi Electr. Corp., Kamakura
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    1389
  • Lastpage
    1392
  • Abstract
    A high-power protection GaN FET switch has been developed. Our invented switching circuit utilizes a new asymmetric series-shunt/shunt configuration. By using the proposed circuit, the power handling capability at isolated state is determined only by the breakdown voltage and the bias voltage of the FETs. So the gate width of the FETs can be determined independently of the power handling capability, and we can overcome the trade-off relationship between the insertion loss at transmission state and the power handling capability at isolated state by using FETs having high breakdown voltage. To verify this methodology, we fabricated the switch with an AlGaN/GaN FET technology, and the circuit achieved the power handling capability of over 100 W, the insertion loss of 0.97 dB, and the isolation of 18.7 dB at 10% bandwidth in S-band.
  • Keywords
    III-V semiconductors; aluminium compounds; field effect transistor switches; gallium compounds; microwave power transistors; microwave switches; power semiconductor switches; switching circuits; wide band gap semiconductors; AlGaN-GaN; S-band protection switch; asymmetric series-shunt/shunt configuration; breakdown voltage; high-power protection GaN FET switch; insertion loss; loss 0.97 dB; power 100 W; power handling capability; switching circuit; Aluminum gallium nitride; Breakdown voltage; FETs; Gallium nitride; Insertion loss; Isolation technology; Propagation losses; Protection; Switches; Switching circuits; AlGaN/GaN; FET; asymmetric configuration; high-power; low-loss; series-shunt/shunt; switch;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380490
  • Filename
    4264095