Title :
Vision feedback for automated nanohandling
Author :
Fatikow, Sergej ; Dahmen, Christian ; Wortmann, Tim ; Tunnell, Robert
Author_Institution :
Div. of Microrobotics & Control Eng., Univ. of Oldenburg, Oldenburg, Germany
Abstract :
The handling of nanoscale objects is a field with high prospects and good perspectives. This paper presents different necessary image processing methods and algorithms, which are needed to enable the reliable automation of nanohandling processes. The imaging sensor used to gain access to the nanoscale world is the scanning electron microscope (SEM). Tasks to be fulfilled on image data from the SEM include object recognition, object tracking and depth estimation. All these algorithms are discussed and validated.
Keywords :
computer vision; image sensors; industrial robots; materials handling; nanotechnology; scanning electron microscopy; automated nanohandling process; depth estimation; image processing methods; imaging sensor; object recognition; object tracking; scanning electron microscope; vision feedback; Automation; Data mining; Feedback; Image processing; Image sensors; Object detection; Object recognition; Scanning electron microscopy; Scanning probe microscopy; Software algorithms;
Conference_Titel :
Information and Automation, 2009. ICIA '09. International Conference on
Conference_Location :
Zhuhai, Macau
Print_ISBN :
978-1-4244-3607-1
Electronic_ISBN :
978-1-4244-3608-8
DOI :
10.1109/ICINFA.2009.5205031