• DocumentCode
    2971762
  • Title

    Analysis and Suppression of Memory Effects in Envelope Elimination and Restoration (EER) Power Amplifiers

  • Author

    Fedorenko, Pavlo ; Kenney, J. Stevenson

  • Author_Institution
    Georgia Inst. of Technol., Atlanta
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    1453
  • Lastpage
    1456
  • Abstract
    A frequency domain cancellation technique was used to examine nonlinearities and associated memory effects of the modulation characteristics of RF power amplifiers (PAs) used in envelope elimination and restoration (EER) systems. Using offset sinusoidal modulation on the drain of a GaAs power amplifier (PA), a measure of the distortion in the amplitude modulation (AM) characteristic, as well as the undesired phase modulation (PM) may be obtained by examining the harmonics of the modulation sidebands. While care was taken to avoid significant frequency response variations in the envelope amplifier and bias feeds, phase deviation of the sideband harmonics relative to the carrier was still observed. Furthermore, it was found that proper termination of the second harmonic of the RF carrier at the PA output reduced this phase deviation, hence allowing for simpler static compensation of the amplitude modulation characteristic.
  • Keywords
    amplitude modulation; frequency response; phase modulation; power amplifiers; RF power amplifiers; amplitude modulation; envelope elimination and restoration power amplifiers; frequency domain cancellation; memory effects; phase modulation; Amplitude modulation; Distortion measurement; Frequency domain analysis; Gallium arsenide; Phase modulation; Power amplifiers; Power measurement; Power system restoration; Radio frequency; Radiofrequency amplifiers; Kahn technique; Power amplifiers; envelope elimination and restoration; memory effects; polar transmitters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380525
  • Filename
    4264112