DocumentCode :
2971819
Title :
The influence of gate bias and structure on the CO sensing performance of SiC based field effect sensors
Author :
Darmastuti, Zhafira ; Pearce, Ruth ; Spetz, Anita Lloyd ; Andersson, Mike
Author_Institution :
Dept. of Phys., Chem., & Biol., Linkoping Univ., Linkoping, Sweden
fYear :
2011
fDate :
28-31 Oct. 2011
Firstpage :
133
Lastpage :
136
Abstract :
SiC based Field Effect Transistor gas sensors with Pt as gate material have previously been shown to exhibit a binary CO response, sharply switching between a small and a large value with increasing CO or decreasing O2 concentration or temperature. In this study Pt gates with different structures have been fabricated by dc magnetron sputtering at different argon pressures and subjected to various CO/O2 mixtures under various temperatures and gate bias conditions. The influence of gate bias and gate structure on the CO response switch point has been investigated. The results suggest that the more porous the gate material or smaller the bias, the lower the temperature or higher the CO concentration required in order to induce the transition between a small and a large response towards CO. These trends are suggested to reflect the adsorption, spill-over, and reaction characteristics of oxygen chemisorbed to the Pt and insulator surfaces.
Keywords :
field effect transistors; gas sensors; silicon compounds; wide band gap semiconductors; CO; DC magnetron sputtering; SiC; argon pressures; field effect transistor gas sensors; gate bias; gate material; gate structure; insulator surfaces; sensing performance; Logic gates; MISFETs; Metals; Sensor phenomena and characterization; Temperature; Temperature sensors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
ISSN :
1930-0395
Print_ISBN :
978-1-4244-9290-9
Type :
conf
DOI :
10.1109/ICSENS.2011.6127261
Filename :
6127261
Link To Document :
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