DocumentCode :
2971878
Title :
Statistical machine control: a practical approach to total productive maintenance of semiconductor equipment
Author :
Lavallart, Frank ; Cooper, Ned
Author_Institution :
Medtronic Mirco-Rel, Tempo, AZ, USA
fYear :
1997
fDate :
13-15 Oct 1997
Firstpage :
81
Lastpage :
87
Abstract :
Statistical Machine Control (SMC) encompasses the total maintenance effect on equipment. This approach steps far beyond the “fix it” attitude that has often been the understood job of a maintenance technician. SMC incorporates Total Quality Management (TQM) practices, the predictive and preventive maintenance programs. The goal of the program is to maximize uptime while continuing: to reduce variation. Variation has an effect on product yields, and equipment can be a major cause of the total variation in a factory. SMC addresses these concerns, and it requires a change in mind set that takes time, training and a lot of energy to bring to fruition. SMC works if the organization is committed to overcome the stumbling blocks along the way. This paper is illustrated with four practical examples
Keywords :
integrated circuit manufacture; maintenance engineering; quality control; semiconductor device manufacture; statistical process control; TQM practices; predictive maintenance programs; preventive maintenance programs; semiconductor equipment; statistical machine control; total productive maintenance; total quality management; Engineering management; Machine control; Management training; Predictive maintenance; Preventive maintenance; Process control; Production facilities; Sliding mode control; Temperature control; Total quality management;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics Manufacturing Technology Symposium, 1997., Twenty-First IEEE/CPMT International
Conference_Location :
Austin, TX
ISSN :
1089-8190
Print_ISBN :
0-7803-3929-0
Type :
conf
DOI :
10.1109/IEMT.1997.626881
Filename :
626881
Link To Document :
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