Title :
Estimation of joint probability density function of delay and leakage power with variable skewness
Author :
Ansari, Md ; Imani, Maryam ; Aghababa, Hossein ; Forouzandeh, Bahjat
Author_Institution :
Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
Abstract :
This paper introduces a new joint probability density function (JPDF) for estimating delay-power distribution. Linear and logarithmic skewness factors have been used for estimating the accurate JPDF. Both proposed models are compared to bivariate normal model for NAND2, NAND3, NOR2, NOR3 circuits and ISCAS85-C432. We verified the accuracy of our proposed model using Nangate 45nm standard cell library. The results indicate that making use of logarithmic skewness, results in a better modeling compared to linear and bivariate models. Employing linear and logarithmic skewnesses, results in 23.3X and 38.5X improvement in R-Squares in respect with constant and bivariate model. Also, using logarithmic skewness reduces the Root Mean Squares Error (RMSE) and Sum of Squared Errors (SSE) by 14.6% and 26.2% respectively.
Keywords :
NAND circuits; NOR circuits; delay estimation; electrical faults; logic design; probability; ISCAS85-C432; NAND2 circuit; NAND3 circuit; NOR2 circuit; NOR3 circuit; Nangate standard cell library; bivariate model; delay estimation; delay-power distribution; leakage power estimation; linear skewness factor; logarithmic skewness factor; probability density function; root mean squares error; size 45 nm; sum of squared errors; Accuracy; Delays; Estimation; Integrated circuit modeling; Joints; Mathematical model; Simulation; Manufacturing process variation; Nano-CMOS technology; Power-Delay joint PDF;
Conference_Titel :
Electronics, Computer and Computation (ICECCO), 2013 International Conference on
Conference_Location :
Ankara
DOI :
10.1109/ICECCO.2013.6718276
