DocumentCode
2971974
Title
Crosstalk effects of avalanche CMOS photodiodes
Author
Hsia, Meng-Lin ; Liu, Zhe Ming ; Chan, Chieh Ning ; Chen, Oscal T.-C.
Author_Institution
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
fYear
2011
fDate
28-31 Oct. 2011
Firstpage
1689
Lastpage
1692
Abstract
This work explores crosstalk effects of avalanche CMOS photodiodes in a 3D sensor array where photodiodes were implemented under different shapes, perimeters, areas, structures and array sizes using the TSMC 0.35μm technology. The breakdown voltages are increased with areas and depths of p-n junctions, and decreased as perimeters of p-n junctions and array sizes increasing. The preferred shape of a photodiode tends to be a circle. Particularly, the breakdown voltage of an avalanche CMOS photodiode with the crosstalk effect is derived based on its physical characteristics. The proposed mathematical model can be beneficial to the design of avalanche CMOS photodiodes in a sensor array.
Keywords
CMOS integrated circuits; avalanche photodiodes; crosstalk; electric breakdown; p-n junctions; 3D sensor array; avalanche CMOS photodiodes; breakdown voltages; crosstalk effects; p-n junctions; Arrays; Avalanche photodiodes; CMOS integrated circuits; CMOS technology; Crosstalk; Photonics; Avalanche photodiode; CMOS photodiode; breakdown voltage; crosstalk effect;
fLanguage
English
Publisher
ieee
Conference_Titel
Sensors, 2011 IEEE
Conference_Location
Limerick
ISSN
1930-0395
Print_ISBN
978-1-4244-9290-9
Type
conf
DOI
10.1109/ICSENS.2011.6127267
Filename
6127267
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