• DocumentCode
    2971974
  • Title

    Crosstalk effects of avalanche CMOS photodiodes

  • Author

    Hsia, Meng-Lin ; Liu, Zhe Ming ; Chan, Chieh Ning ; Chen, Oscal T.-C.

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
  • fYear
    2011
  • fDate
    28-31 Oct. 2011
  • Firstpage
    1689
  • Lastpage
    1692
  • Abstract
    This work explores crosstalk effects of avalanche CMOS photodiodes in a 3D sensor array where photodiodes were implemented under different shapes, perimeters, areas, structures and array sizes using the TSMC 0.35μm technology. The breakdown voltages are increased with areas and depths of p-n junctions, and decreased as perimeters of p-n junctions and array sizes increasing. The preferred shape of a photodiode tends to be a circle. Particularly, the breakdown voltage of an avalanche CMOS photodiode with the crosstalk effect is derived based on its physical characteristics. The proposed mathematical model can be beneficial to the design of avalanche CMOS photodiodes in a sensor array.
  • Keywords
    CMOS integrated circuits; avalanche photodiodes; crosstalk; electric breakdown; p-n junctions; 3D sensor array; avalanche CMOS photodiodes; breakdown voltages; crosstalk effects; p-n junctions; Arrays; Avalanche photodiodes; CMOS integrated circuits; CMOS technology; Crosstalk; Photonics; Avalanche photodiode; CMOS photodiode; breakdown voltage; crosstalk effect;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2011 IEEE
  • Conference_Location
    Limerick
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-9290-9
  • Type

    conf

  • DOI
    10.1109/ICSENS.2011.6127267
  • Filename
    6127267