DocumentCode :
2971974
Title :
Crosstalk effects of avalanche CMOS photodiodes
Author :
Hsia, Meng-Lin ; Liu, Zhe Ming ; Chan, Chieh Ning ; Chen, Oscal T.-C.
Author_Institution :
Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chiayi, Taiwan
fYear :
2011
fDate :
28-31 Oct. 2011
Firstpage :
1689
Lastpage :
1692
Abstract :
This work explores crosstalk effects of avalanche CMOS photodiodes in a 3D sensor array where photodiodes were implemented under different shapes, perimeters, areas, structures and array sizes using the TSMC 0.35μm technology. The breakdown voltages are increased with areas and depths of p-n junctions, and decreased as perimeters of p-n junctions and array sizes increasing. The preferred shape of a photodiode tends to be a circle. Particularly, the breakdown voltage of an avalanche CMOS photodiode with the crosstalk effect is derived based on its physical characteristics. The proposed mathematical model can be beneficial to the design of avalanche CMOS photodiodes in a sensor array.
Keywords :
CMOS integrated circuits; avalanche photodiodes; crosstalk; electric breakdown; p-n junctions; 3D sensor array; avalanche CMOS photodiodes; breakdown voltages; crosstalk effects; p-n junctions; Arrays; Avalanche photodiodes; CMOS integrated circuits; CMOS technology; Crosstalk; Photonics; Avalanche photodiode; CMOS photodiode; breakdown voltage; crosstalk effect;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Sensors, 2011 IEEE
Conference_Location :
Limerick
ISSN :
1930-0395
Print_ISBN :
978-1-4244-9290-9
Type :
conf
DOI :
10.1109/ICSENS.2011.6127267
Filename :
6127267
Link To Document :
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