DocumentCode :
2972163
Title :
A CUSUM chart using absolute sample values to monitor process mean and variance
Author :
Wu, Zhang ; Yang, Mei
Author_Institution :
Sch. of Mech. & Aerosp. Eng., Nanyang Technol. Univ., Singapore, Singapore
fYear :
2009
fDate :
8-11 Dec. 2009
Firstpage :
414
Lastpage :
418
Abstract :
In Statistical Process Control (SPC), when dealing with a quality characteristic x that is a variable, it is usually necessary to monitor both the mean value and variability. By inspecting the absolute value of sample mean shift, a single CUSUM chart (called the ABS CUSUM chart) has been devised by an optimization algorithm and fully investigated for this purpose. The optimization algorithm (called the holistic algorithm) facilitates the determination of the charting parameters of the charts and increases their overall detection effectiveness. The results of performance studies show that the overall performance of the ABS CUSUM chart is as good as an optimal 3-CUSUM scheme (a scheme incorporating three individual CUSUM charts). However, since the ABS CUSUM chart is easier for implementation and design, it may be more suitable for many SPC applications in which both mean and variance of a variable have to be monitored.
Keywords :
control charts; optimisation; quality control; statistical process control; CUSUM chart; absolute sample value; holistic algorithm; optimal 3-CUSUM scheme; optimization algorithm; process mean monitoring; statistical process control; variability; Aerospace engineering; Control charts; Design optimization; Gaussian distribution; Markov processes; Monitoring; Process control; Quality control; Signal design; Statistics; Markov processes; Quality control; loss function; quality control chart; statistical process control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4869-2
Electronic_ISBN :
978-1-4244-4870-8
Type :
conf
DOI :
10.1109/IEEM.2009.5373322
Filename :
5373322
Link To Document :
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