Title :
A Linear Design of Temperature Detecting Circuits with Pt Resistance
Author_Institution :
Wuhan Inst. of Technol., Wuhan
Abstract :
A correction method for non-linear Pt resistance temperature measurement based on the principle of A/D conversion is introduced. The design principle of Pt resistance linear temperature measurement is analyzed and a new method for interfacing A/D converter with single chip computer 89c52 is provided together with the experimental data.
Keywords :
analogue-digital conversion; microprocessor chips; resistance thermometers; temperature measurement; A/D conversion; linear design; resistance temperature measurement; single chip computer; temperature detecting circuits; Bridge circuits; Computer interfaces; Electrical resistance measurement; Intelligent transportation systems; Measurement standards; Power electronics; Temperature distribution; Temperature measurement; Time measurement; Voltage;
Conference_Titel :
Power Electronics and Intelligent Transportation System, 2008. PEITS '08. Workshop on
Conference_Location :
Guangzhou
Print_ISBN :
978-0-7695-3342-1
DOI :
10.1109/PEITS.2008.128
