DocumentCode :
2972339
Title :
Probing the electronic response of nanostructures by THz time-domain spectroscopy
Author :
Heinz, Tony F.
Author_Institution :
Dept. of Phys. & Electr. Eng., Columbia Univ., New York, NY, USA
Volume :
2
fYear :
2005
fDate :
19-23 Sept. 2005
Firstpage :
473
Abstract :
THz spectroscopy, by allowing one to measure the frequency-dependent complex conductivity, provides a powerful means of examining the charge transport in solids. The approach is of particular value for investigations of nanoscale systems, for which it is typically difficult to make direct electrical contact to the nanostructures under study. We describe recent applications of THz time-domain spectroscopy to probing nanostructures, including semiconductor nanoparticles and single-wall carbon nanotubes. Because of the pulsed nature of the THz probe radiation in the time-domain spectroscopy approach, the method is readily applicable to photo-excited systems, thus permitting one to examine photo-doped nanostructures and their dynamics. We are consequently able to obtain fundamental information about the charge carriers in nanostructures, including their lifetime and the nature of their response to applied electric fields.
Keywords :
carbon nanotubes; nanoparticles; nanotechnology; submillimetre wave spectroscopy; time-domain analysis; charge carriers; charge transport; electric fields; electrical contact; electronic response; nanoscale systems; photo-doped nanostructures; photo-excited systems; semiconductor nanoparticles; single-wall carbon nanotubes; terahertz probe radiation; terahertz spectroscopy; time-domain spectroscopy; Charge measurement; Conductivity measurement; Contacts; Current measurement; Frequency measurement; Nanoparticles; Semiconductor nanostructures; Solids; Spectroscopy; Time domain analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN :
0-7803-9348-1
Type :
conf
DOI :
10.1109/ICIMW.2005.1572618
Filename :
1572618
Link To Document :
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