• DocumentCode
    2972382
  • Title

    Photosensitive polyimide for IC devices

  • Author

    Kojima, Mitsumasa ; Sekine, Hiroyoshi ; Suzuki, Hiroshi ; Satou, Hidetaka ; Makino, Daisuke ; Kataoka, Fumio ; Tanaka, Jun ; Shouji, Fusaji

  • Author_Institution
    Hitachi Chem. Co. Ltd., Ibaraki, Japan
  • fYear
    1989
  • fDate
    22-24 May 1989
  • Firstpage
    920
  • Lastpage
    924
  • Abstract
    Photosensitive polyimide has potential applications for interlayer insulation, alpha-ray shielding, and buffer coating of IC and LSI devices because it offers reduction in processing time. There are two main methods used to photosensitize polyimide. One is based on ion bonding and the other on covalent bonding between polyamic acid and photosensitive groups. The sensitivity, resolution, and mechanical properties such as tensile strength, elongation, and adhesion strength of the photosensitive polyimides have been investigated. The studies indicate that the covalent-bonding type is better than the ion-bonding type in terms of optical properties; the physical properties of the ion-bonding type, however, are much better. In terms of the physical properties conventional nonphotosensitive polyimides still have superior properties compared to photosensitive polyimides
  • Keywords
    adhesion; elongation; integrated circuit technology; optical properties of substances; polymer films; sensitivity; tensile strength; IC devices; LSI devices; adhesion strength; alpha-ray shielding; buffer coating; covalent bonding; elongation; interlayer insulation; ion bonding; mechanical properties; optical properties; photosensitive groups; photosensitive polyimides; polyamic acid; polymer films; resolution; sensitivity; tensile strength; Adhesives; Application specific integrated circuits; Bonding; Coatings; Insulation; Large scale integration; Mechanical factors; Optical buffering; Optical sensors; Polyimides;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components Conference, 1989. Proceedings., 39th
  • Conference_Location
    Houston, TX
  • Type

    conf

  • DOI
    10.1109/ECC.1989.77857
  • Filename
    77857