DocumentCode
2972523
Title
Ultrasonic diffraction along axes of two-fold symmetry
Author
Papadakis, Emmanuel P. ; Margetan, Frank ; Newberry, Byron P.
Author_Institution
Center for Nondestructive Evaluation, Iowa State Univ., Ames, IA, USA
fYear
1989
fDate
3-6 Oct 1989
Firstpage
1221
Abstract
Agreement has been achieved between ultrasonic diffraction losses as measured and calculated for twofold symmetry axes. Measurements were made by the pulse-echo method with essentially monochromatic RF bursts and X-cut quartz transducers on [110] Si, Ge, and NaCl. Calculations were made using the Thompson-Newberry (T-N) measurement model which expresses the wavefield of the transducer as a Gauss-Hermite series and expands the slowness surface of the anisotropic medium in terms up through quadratic with azimuthal variability. In this formulation the [110] direction is a saddle point. The measurement model was checked against previous experimental and theoretical work and was found to reproduce the earlier results exactly. In principle, the T-N measurement model can handle diffraction losses in arbitrary directions
Keywords
elemental semiconductors; germanium; silicon; sodium compounds; ultrasonic diffraction; Ge; NaCl; Si; [110] direction; axes of two-fold symmetry; diffraction losses; measurement model; pulse-echo method; quartz transducers; semiconductor; ultrasonic diffraction; wavefield; Attenuation; Bonding; Diffraction; Equations; Gaussian approximation; Gaussian distribution; Geometry; Propagation losses; Shape; Transducers;
fLanguage
English
Publisher
ieee
Conference_Titel
Ultrasonics Symposium, 1989. Proceedings., IEEE 1989
Conference_Location
Montreal, Que.
Type
conf
DOI
10.1109/ULTSYM.1989.67183
Filename
67183
Link To Document