• DocumentCode
    2972523
  • Title

    Ultrasonic diffraction along axes of two-fold symmetry

  • Author

    Papadakis, Emmanuel P. ; Margetan, Frank ; Newberry, Byron P.

  • Author_Institution
    Center for Nondestructive Evaluation, Iowa State Univ., Ames, IA, USA
  • fYear
    1989
  • fDate
    3-6 Oct 1989
  • Firstpage
    1221
  • Abstract
    Agreement has been achieved between ultrasonic diffraction losses as measured and calculated for twofold symmetry axes. Measurements were made by the pulse-echo method with essentially monochromatic RF bursts and X-cut quartz transducers on [110] Si, Ge, and NaCl. Calculations were made using the Thompson-Newberry (T-N) measurement model which expresses the wavefield of the transducer as a Gauss-Hermite series and expands the slowness surface of the anisotropic medium in terms up through quadratic with azimuthal variability. In this formulation the [110] direction is a saddle point. The measurement model was checked against previous experimental and theoretical work and was found to reproduce the earlier results exactly. In principle, the T-N measurement model can handle diffraction losses in arbitrary directions
  • Keywords
    elemental semiconductors; germanium; silicon; sodium compounds; ultrasonic diffraction; Ge; NaCl; Si; [110] direction; axes of two-fold symmetry; diffraction losses; measurement model; pulse-echo method; quartz transducers; semiconductor; ultrasonic diffraction; wavefield; Attenuation; Bonding; Diffraction; Equations; Gaussian approximation; Gaussian distribution; Geometry; Propagation losses; Shape; Transducers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ultrasonics Symposium, 1989. Proceedings., IEEE 1989
  • Conference_Location
    Montreal, Que.
  • Type

    conf

  • DOI
    10.1109/ULTSYM.1989.67183
  • Filename
    67183