Title :
New Applications for High Average Power Beams
Author :
Neau, E.L. ; Turman, B.N. ; Patterson, E.L.
Keywords :
Chemical technology; Chemistry; Costs; Electron beams; Ion beams; Laboratories; Magnetic switching; Physics; Thermal management; Voltage;
Conference_Titel :
Pulsed Power Conference, 1993. Digest of Technical Papers., Ninth IEEE International
Conference_Location :
Albuquerque, NM, USA
Print_ISBN :
0-7803-1415-8
DOI :
10.1109/PPC.1993.513325
