DocumentCode :
2972717
Title :
Automatic selection of recognition errors by respeaking the intended text
Author :
Vertanen, Keith ; Kristensson, Per Ola
Author_Institution :
Cavendish Lab., Univ. of Cambridge, Cambridge, UK
fYear :
2009
fDate :
Nov. 13 2009-Dec. 17 2009
Firstpage :
130
Lastpage :
135
Abstract :
We investigate how to automatically align spoken corrections with an initial speech recognition result. Such automatic alignment would enable one-step voice-only correction in which users simply respeak their intended text. We present three new models for automatically aligning corrections: a 1-best model, a word confusion network model, and a revision model. The revision model allows users to alter what they intended to write even when the initial recognition was completely correct. We evaluate our models with data gathered from two user studies. We show that providing just a single correct word of context dramatically improves alignment success from 65% to 84%. We find that a majority of users provide such context without being explicitly instructed to do so. We find that the revision model is superior when users modify words in their initial recognition, improving alignment success from 73% to 83%. We show how our models can easily incorporate prior information about correction location and we show that such information aids alignment success. Last, we observe that users speak their intended text faster and with fewer re-recordings than if they are forced to speak misrecognized text.
Keywords :
speech recognition; text analysis; word processing; automatically aligning corrections; recognition errors; revision model; speak misrecognized text; speech recognition; spoken corrections; voice-only correction; word confusion network model; Automatic speech recognition; Capacitive sensors; Decoding; Dictionaries; Error correction; Injuries; Laboratories; Mice; Speech recognition; Text recognition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Automatic Speech Recognition & Understanding, 2009. ASRU 2009. IEEE Workshop on
Conference_Location :
Merano
Print_ISBN :
978-1-4244-5478-5
Electronic_ISBN :
978-1-4244-5479-2
Type :
conf
DOI :
10.1109/ASRU.2009.5373347
Filename :
5373347
Link To Document :
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