• DocumentCode
    2972964
  • Title

    Analysis of the efficiency of spinning-current techniques thru compact modeling

  • Author

    Madec, Morgan ; Kammerer, Jean-baptiste ; Hébrard, Luc ; Lallement, Christophe

  • Author_Institution
    Centre Nat. de Rech. Scientifiques, Univ. de Strasbourg, Strasbourg, France
  • fYear
    2011
  • fDate
    28-31 Oct. 2011
  • Firstpage
    542
  • Lastpage
    545
  • Abstract
    Hall-sensors integrated in CMOS technology are good candidates for the design of low-cost magnetometers. However, one of their major limitations is the 0-field offset, and it is essential to take this effect into account in the very early steps of the design process. For this purpose, we recently developed a new compact model for horizontal cross-shaped Hall-effect device. It is based on physical considerations and takes all the device offset sources into account. For applications where the offset issue is critical, the well known spinning-current technique (SC) can be used to reduce the offset. In this paper, we first analyze the efficiency of four different implementations (number of phases, type of bias) of the SC technique on the different offset sources. Second, we compare these SC techniques by Monte-Carlo analysis. Simulations lead to several interesting conclusions, such as the fact that the best offset cancellation is achieved with the 4-phases SC and a current bias.
  • Keywords
    CMOS integrated circuits; Hall effect devices; Monte Carlo methods; magnetoelectronics; magnetometers; CMOS technology; Hall effect device; Hall sensor; Monte Carlo analysis; compact modeling; low cost magnetometer; spinning current technique; Magnetic sensors; Resistance; Resistors; Semiconductor device modeling; Spinning; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2011 IEEE
  • Conference_Location
    Limerick
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-9290-9
  • Type

    conf

  • DOI
    10.1109/ICSENS.2011.6127318
  • Filename
    6127318