Title :
Accurate measurement system for low loss materials
Author :
Afsar, Mohammed N. ; Chen, Shu ; Wang, Yong
Author_Institution :
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
Abstract :
This paper reports an improved Fabry-Perot open resonator operating at 60 GHz which is used to measure the dielectric properties of low-absorbing materials. Two techniques are employed, namely, frequency-variation and cavity-length-variation techniques. High resolution can be reached as small as 10 nanometers, which makes the resonator an accurate system to provide precise measurements.
Keywords :
Fabry-Perot resonators; dielectric loss measurement; dielectric losses; dielectric materials; measurement systems; millimetre wave measurement; 60 GHz; Fabry-Perot open resonator; cavity-length-variation technique; dielectric properties; frequency-variation technique; low absorbing materials; low loss materials; measurement system; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Electric variables measurement; Fabry-Perot; Frequency; Loss measurement; Mirrors; Permittivity measurement; Resonance;
Conference_Titel :
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN :
0-7803-9348-1
DOI :
10.1109/ICIMW.2005.1572652
