DocumentCode
2972976
Title
Accurate measurement system for low loss materials
Author
Afsar, Mohammed N. ; Chen, Shu ; Wang, Yong
Author_Institution
Dept. of Electr. & Comput. Eng., Tufts Univ., Medford, MA, USA
Volume
2
fYear
2005
fDate
19-23 Sept. 2005
Firstpage
537
Abstract
This paper reports an improved Fabry-Perot open resonator operating at 60 GHz which is used to measure the dielectric properties of low-absorbing materials. Two techniques are employed, namely, frequency-variation and cavity-length-variation techniques. High resolution can be reached as small as 10 nanometers, which makes the resonator an accurate system to provide precise measurements.
Keywords
Fabry-Perot resonators; dielectric loss measurement; dielectric losses; dielectric materials; measurement systems; millimetre wave measurement; 60 GHz; Fabry-Perot open resonator; cavity-length-variation technique; dielectric properties; frequency-variation technique; low absorbing materials; low loss materials; measurement system; Dielectric loss measurement; Dielectric materials; Dielectric measurements; Electric variables measurement; Fabry-Perot; Frequency; Loss measurement; Mirrors; Permittivity measurement; Resonance;
fLanguage
English
Publisher
ieee
Conference_Titel
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN
0-7803-9348-1
Type
conf
DOI
10.1109/ICIMW.2005.1572652
Filename
1572652
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