• DocumentCode
    2973032
  • Title

    Frequency Deviation Due to a Sample Insertion Hole in a Cylindrical Cavity by Circuital Analysis

  • Author

    Penaranda-Foix, Felipe L. ; Catala-Civera, Jose M. ; Canos-Marin, Antoni J. ; Garcia-Banos, Beatriz

  • Author_Institution
    Tech. Univ. of Valencia, Valencia
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    1683
  • Lastpage
    1686
  • Abstract
    One of the most widely used techniques for dielectric material characterization is the partially filled circular cavity. The exact analysis of this structure is well known in the bibliography. But in practice when the measured material is introduced through a circular pipe below its cut off frequency a problem arises. Traditionally the tube effect is neglected, but then some errors appear, whose magnitude depends on the material properties and the cavity and tube dimensions. In some cases, the errors introduced are noticeable and the tube effect should not be neglected. Some authors have tried to evaluate in a simple way this effect, but their equations are valid only in a restricted range of practical configurations. In this paper we present a model of this effect based on a circuital analysis of the full structure. A simple monomode equation valid for any material property and cavity dimensions is given and a saturation effect, not reported before, is analyzed.
  • Keywords
    cavity resonators; dielectric materials; network analysis; cavity dimensions; circuit analysis; circular pipe; cylindrical cavity; dielectric material characterization; frequency deviation; material properties; partially filled circular cavity; sample insertion hole; simple monomode equation; tube effect; Bibliographies; Cavity perturbation methods; Cavity resonators; Circuit analysis; Dielectric materials; Dielectric measurements; Equations; Frequency measurement; Material properties; Mode matching methods; Cavity perturbation methods; Cavity resonators; Circuit analysis; Mode matching methods;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380030
  • Filename
    4264174