DocumentCode
2973301
Title
Two-dimensional software reliability measurement technologies
Author
Inoue, Shinji ; Yamada, Shigeru
Author_Institution
Grad. Sch. of Eng., Tottori Univ., Tottori, Japan
fYear
2009
fDate
8-11 Dec. 2009
Firstpage
223
Lastpage
227
Abstract
This paper discusses two-dimensional software reliability measurement technologies, which describe a software reliability growth process depending on two-types of software reliability growth factors: Testing-time and testing-effort factors. From the view point of actual software failure-occurrence mechanism, it is natural to consider that a software reliability growth process depends on not only testing-time factor but also other software reliability growth factors, i.e., testing-effort factors, such as test-execution time, testing-skill of test engineers, testing-coverage. From such reason, the two-dimensional software reliability measurement technologies enable us to conduct more feasible software reliability assessment than the one-dimensional (conventional) software reliability measurement approach, in which it is assumed that the software reliability growth process depends only on testing-time. We discuss two-types of two-dimensional software reliability growth modeling approaches for feasible software reliability assessment, and conduct goodness-of-fit comparisons of our models with existing one-dimensional software reliability growth models. Finally, as one of the examples for two-dimensional software reliability analysis, we show examples of the application of our two-dimensional software reliability growth model by using actual data.
Keywords
program testing; project management; software management; software reliability; one-dimensional software reliability measurement approach; software failure occurrence mechanism; software project management; software reliability assessment; software reliability growth process; testing-effort factors; testing-time factor; two-dimensional software reliability measurement technologies; Application software; Fault detection; Project management; Reliability engineering; Software measurement; Software reliability; Software systems; Software testing; Stochastic processes; System testing; Goodness-of-Fit; Modeling Frameworks; Testing-Effort Factor; Testing-Time Factor; Two-Dimensional Software Reliability Growth Models; Two-Dimensional Stochastic Processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-4869-2
Electronic_ISBN
978-1-4244-4870-8
Type
conf
DOI
10.1109/IEEM.2009.5373378
Filename
5373378
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