Title :
Failure rate calculation: Extending JESD74/JESD74A to any sample size
Author :
Yang, Siyuan Frank ; Chien, Wei-Ting Kary
Author_Institution :
Corp. Quality-Reliability Center, Semicond. Manuf. Int. Corp. (SMIC), Shanghai, China
Abstract :
The failure rate has been an important index in product reliability. Practitioners in microelectronics reliability have been using JEDEC standards to determine whether a product will pass the requirement of a prespecified failure rate. The limitation of the current X 2 method used by JESD74 and its revision JESD74A in determining the upper confidence limit for failure rate is pointed out and discussed. Very large relative errors such as 40% have been shown for certain sample sizes which are not sufficiently large enough. This paper provides practitioners an exact method to calculate the confidence bounds of failure rates and therefore makes JESD74 and its revision JESD74A complete to any sample size.
Keywords :
failure analysis; maintenance engineering; reliability; JEDEC standards; JESD74/JESD74A; X2 method; failure rate calculation; microelectronics reliability; product reliability; sample size; upper confidence limit; Electronic components; Electronics industry; Hazards; Life estimation; Life testing; Microelectronics; Semiconductor device manufacture; Semiconductor device reliability; Solid state circuits; Statistics; Failure rate; X2 method; accelerated life test; confidence limits; exact F method; sample size;
Conference_Titel :
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4869-2
Electronic_ISBN :
978-1-4244-4870-8
DOI :
10.1109/IEEM.2009.5373384
