• DocumentCode
    2973444
  • Title

    Microwave Dissipation Spectra in Arrays of Silicon Nanowires

  • Author

    Lee, Mark ; Highstrete, Clark ; Vallett, Aaron ; Dilts, Sarah M. ; Redwing, Joan M. ; Mayer, Theresa S.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    1765
  • Lastpage
    1767
  • Abstract
    The transmission and reflection scattering parameters of arrays of silicon nanowires (SiNWs) directly assembled onto co-planar waveguides (CPWs) have been measured from 0.1 to 50 GHz at room temperature. Typical arrays consisted of between 103 to 104 SiNWs aligned parallel to the electric field polarization of the propagating microwave field. Scattering parameters were measured on CPWs both before and after nanomaterial assembly. Highly reproducible CPW characteristics and careful use of control samples to quantify systematic reproducibility allowed clear separation of nanomaterial effects from the characteristics of the bare CPWs. Arrays of n doped SiNWs consistently showed frequency-dependent power dissipation. Nominally undoped SiNW arrays, however, showed no measurable microwave power dissipation up to 50 GHz.
  • Keywords
    S-parameters; coplanar waveguides; microwave materials; microwave spectra; nanotechnology; nanowires; silicon; Si; SiNW array; coplanar waveguides; electric field polarization; frequency 0.1 GHz to 50 GHz; microwave device; microwave dissipation spectra; microwave measurement; microwave propagation; nanomaterial assembly; nanotechnology; reflection scattering parameters; silicon nanowires; temperature 293 K to 298 K; transmission scattering parameters; Assembly; Microwave antenna arrays; Nanowires; Polarization; Power dissipation; Reflection; Scattering parameters; Silicon; Temperature; Waveguide components; Microwave measurements; materials testing; microwave devices; nanotechnology;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380071
  • Filename
    4264196