Title :
Characterization of building materials for the modeling of pico-cellular THz communication systems
Author :
Kleine-Ostmann, T. ; Piesiewicz, R. ; Krumbholz, N. ; Mittleman, D. ; Kürner, T. ; Koch, M.
Author_Institution :
Inst. fur Hochfrequenztech., Tech. Univ. Braunschweig, Germany
Abstract :
Ray-tracing modeling of future indoor pico-cellular communication systems requires knowledge of the wall reflectivity at different incidence angles. We present THz-TDS transmission measurements of building materials from which we extract the frequency dependent reflectivity using Fresnel´s equations. We verify our results comparing them to reflection measurements at selected incidence angles.
Keywords :
building materials; electromagnetic wave absorption; electromagnetic wave reflection; electromagnetic wave refraction; electromagnetic wave transmission; materials testing; picocellular radio; submillimetre wave measurement; submillimetre wave propagation; submillimetre wave receivers; walls; Fresnel equations; THz-TDS transmission measurement; building materials; indoor pico-cellular communication; pico-cellular THz communication system; ray tracing modeling; wall reflectivity; Absorption; Building materials; Dielectric measurements; Frequency measurement; Fresnel reflection; Geometry; Glass; Ray tracing; Refractive index; Time domain analysis;
Conference_Titel :
Infrared and Millimeter Waves and 13th International Conference on Terahertz Electronics, 2005. IRMMW-THz 2005. The Joint 30th International Conference on
Print_ISBN :
0-7803-9348-1
DOI :
10.1109/ICIMW.2005.1572680
