Rigorous testing using SnapShot

Author

Factor, Michael ; Farchi, Eitan ; Ur, Shmuel

Author_Institution

IBM Haifa Res. Center, Israel

fYear

1997

fDate

18-19 Jun 1997

Firstpage

12

Lastpage

21

Abstract

Introduces a new software testing concept called SnapShot. SnapShot is a testing mechanism which is composed of two components. The first component instruments the program to be tested with SnapShot statements, which are used to produce a special trace during the program execution. The second component implements post-processing on the trace. SnapShot implicitly defines a user-defined coverage criterion and supports its implementation. We have applied SnapShot to a variety of areas, including serial, parallel and object-oriented programs and VHDL designs

Keywords

hardware description languages; program diagnostics; program testing; SnapShot; VHDL designs; object-oriented programs; parallel programs; program execution trace; serial programs; software testing mechanism; trace post-processing; user-defined coverage criterion; Concurrent computing; Counting circuits; Instruments; Investments; Modems; Operating systems; Programming; Runtime; Software testing; Very large scale integration;

fLanguage

English

Publisher

ieee

Conference_Titel

Computer Systems and Software Engineering, 1997., Proceedings of the Eighth Israeli Conference on

Conference_Location

Herzliya

Print_ISBN

0-8186-8135-7

Type

conf

DOI

10.1109/ICCSSE.1997.599871

Filename

599871