DocumentCode
2973660
Title
Hot-Switching Test of Non-Contact Type MEMS Switch
Author
Shim, Eun Sub ; Park, Jaehong ; Choi, Wooyeol ; Kim, Youngmin ; Kwon, Youngwoo ; No, Jong Seon ; Nam, Sangwook ; Dong-Il Cho
Author_Institution
Seoul Nat. Univ., Seoul
fYear
2007
fDate
3-8 June 2007
Firstpage
1809
Lastpage
1812
Abstract
This paper presents the performance and power handling properties of a capacitive MEMS switch. The switch is a completely non-contact-type switch built with several capacitors that contain air gaps, and free from contact failures that frequently occur in contact-type switches. The switch was designed for 24 GHz automotive radar applications, and the average RF performance of the fabricated switches includes insertion loss of 0.5 dB and isolation of 20 dB at 24 GHz. The lifetime, power-handling properties, and linearity are examined in a hot-switching mode. After 109 continuous cycles in a hot-switching mode with 18 mW RF input power, mechanical failures or RF performance degradation were not detected. Power handling capacity of 0.9 W under hot-switching condition was achieved.
Keywords
life testing; microswitches; microwave switches; RF input power; automotive radar application; capacitive MEMS switch; capacitor; frequency 24 GHz; hot-switching test; insertion loss; lifetime; linearity; loss 0.5 dB; noncontact type MEMS switch; power 0.9 W; power 18 mW; power handling capacity; power handling property; Air gaps; Automotive engineering; Capacitors; Contacts; Microswitches; Performance loss; Radar applications; Radio frequency; Switches; Testing; RF MEMS; lifetime; linearity; power handling; switch;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium, 2007. IEEE/MTT-S International
Conference_Location
Honolulu, HI
ISSN
0149-645X
Print_ISBN
1-4244-0688-9
Electronic_ISBN
0149-645X
Type
conf
DOI
10.1109/MWSYM.2007.380100
Filename
4264208
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