• DocumentCode
    2973870
  • Title

    Streak-mode optical sensor in standard BiCMOS technology

  • Author

    Zlatanski, Martin ; Uhring, Wilfried

  • Author_Institution
    Corp. Res., ABB Switzerland Ltd., Baden-Dättwil, Switzerland
  • fYear
    2011
  • fDate
    28-31 Oct. 2011
  • Firstpage
    1604
  • Lastpage
    1607
  • Abstract
    A streak-mode optical sensor suitable for the accurate observation of nanosecond luminous phenomena is presented. The imager is fabricated in a standard 0.35 μm SiGe BiCMOS technology. It reaches a total acquisition rate of 512 GS/s and a temporal resolution of 490 ps at λ = 400 nm. The sensor has been successfully employed to acquire the fluorescence profile of a stilbene sample, demonstrating its capability to record nanosecond-order transients with high temporal resolution.
  • Keywords
    BiCMOS integrated circuits; CMOS image sensors; Ge-Si alloys; optical sensors; SiGe; bit rate 512 Gbit/s; nanosecond luminous phenomena; nanosecond-order transients; size 0.35 mum; standard BiCMOS technology; streak-mode optical sensor; wavelength 400 nm; Bandwidth; Cameras; Computer architecture; Delay; Fluorescence; Optical imaging; Optical sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Sensors, 2011 IEEE
  • Conference_Location
    Limerick
  • ISSN
    1930-0395
  • Print_ISBN
    978-1-4244-9290-9
  • Type

    conf

  • DOI
    10.1109/ICSENS.2011.6127362
  • Filename
    6127362
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2973870