• DocumentCode
    2974214
  • Title

    Transient Analysis of Mode Structures and Quantification of Crosstalk in Printed Metal Strips

  • Author

    Ahmed, Shahid ; Linton, David

  • Author_Institution
    Queen´´s Univ. of Belfast, Belfast
  • fYear
    2007
  • fDate
    3-8 June 2007
  • Firstpage
    1919
  • Lastpage
    1922
  • Abstract
    A detailed analysis of mode structures inside coupled microstrip lines and their correlation with crosstalk between traces has been performed. The use of finite-difference time-domain and singular value decomposition methods for modal identification followed by cross correlation for crosstalk prediction is demonstrated in this paper. The combination of these methods is robust, versatile and ideal for pulsed applications in an inhomogeneous, anisotropic multi-layer substrate with complex 3D structures. Moreover, all possible modes are extracted in a single analysis. This novel approach provides a quantitative measurement of crosstalk by establishing correlation between modes evolving inside the source line and the field waveforms coupled with the victim line. To our knowledge, this is the first time such a study has been performed. The effects of line topology and pulse characteristics are examined. At the early stage of pulse evolution, the TEM mode of the source line dictates coupling, however, as the pulse advances the higher-order TM mode dominates and exhibits significant contribution to the evolution of the waveform coupled with the victim line which is confirmed by cross-correlation. This study has physical significance in devising systems for suppressing unwanted modes responsible for crosstalk and radiation leakage due to UWB pulses.
  • Keywords
    crosstalk; finite difference time-domain analysis; microstrip lines; modal analysis; singular value decomposition; transient analysis; FDTD analysis; SVD analysis; TEM mode; TM mode; coupled microstrip lines; crosstalk prediction; finite-difference time-domain methods; inhomogeneous anisotropic multilayer substrate; modal identification; mode structures; printed metal strips; pulse characteristics; radiation leakage; singular value decomposition methods; transient analysis; Coupled mode analysis; Crosstalk; Finite difference methods; Microstrip; Performance analysis; Robustness; Singular value decomposition; Strips; Time domain analysis; Transient analysis; Cross-correlation; SVD; TEM; TM; UWB;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium, 2007. IEEE/MTT-S International
  • Conference_Location
    Honolulu, HI
  • ISSN
    0149-645X
  • Print_ISBN
    1-4244-0688-9
  • Electronic_ISBN
    0149-645X
  • Type

    conf

  • DOI
    10.1109/MWSYM.2007.380149
  • Filename
    4264238