Title :
Quantitative analyses on claim structures of patent applications filed by market leaders in the fields of analyzing and diagnostic devices
Author :
Miyazawa, Takashi ; Osada, Hiroshi
Author_Institution :
Intellectual Property Div., Seiko Epson Corp., Fujimi, Japan
Abstract :
The present study investigates relationships between claim structures of patent applications and market shares of analyzing and diagnostic devices in Japan. In consequence, average numbers of total independent claims of patent application filed by firms whose market shares are in the top positions in their respective markets are significantly greater than those of firms whose shares are 10% or smaller in their respective markets. This result indicates that the number of total independent claims, which is one of important factors for the competitiveness of patent, strongly correlates with high market share.
Keywords :
patents; Japan; analyzing devices; claim structures; diagnostic devices; firms; market leaders; market shares; patent applications; total independent claims; Image analysis; Innovation management; Inspection; Intellectual property; Magnetic analysis; Magnetic resonance imaging; Medical diagnostic imaging; Nanotechnology; Scanning probe microscopy; Testing; Analyzing and diagnostic devices; Claim structures; Competitiveness of patent; Independent claims; Market share; Patent applications;
Conference_Titel :
Industrial Engineering and Engineering Management, 2009. IEEM 2009. IEEE International Conference on
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-4869-2
Electronic_ISBN :
978-1-4244-4870-8
DOI :
10.1109/IEEM.2009.5373436